Laboratory / Equipments

館内マップ

6号館

Thermo Nicolet NEXUS 670 フーリエ変換赤外分光光度計

IR

Thermo Nicolet

NEXUS 670 FT-IR Spectrometer

When a sample is irradiated with infrared light, some of it is absorbed by the sample and the other is transmitted. Since the infrared energy corresponds to the energy levels of molecular vibration and rotation, the obtained spectrum can be used to study the molecular structure of the sample.
This device can be used for measurement using the transmission method.

日本分光 V-770 紫外可視近赤外分光光度計

UV

JASCO
V-770 UV-visible/NIR Spectrophotometer

When a sample is irradiated with ultraviolet, visible, or near-infrared light, some of the light is absorbed by the sample and the other is transmitted. The energy of these lights corresponds to the energy levels of the electronic transitions of the molecule, so the obtained spectra can be used to determine the electronic state of the sample.

日本分光 MSV-370 顕微紫外可視近赤外分光光度計

UV顕微鏡

JASCO
MSV-370 Microscopic UV-visible/NIR Spectrophotometer

When a sample is irradiated with ultraviolet, visible, or near-infrared light, some of the light is absorbed by the sample and the other is transmitted. The energy of these lights corresponds to the energy levels of the electronic transitions of the molecule, so the obtained spectra can be used to determine the electronic state of the sample.
This device can be used for measurement using microscopy images.

Bruker AVANCEII+ NMR分光計 UltraShield Plus 超伝導マグネット(9.4 T)

NMR

Bruker
AVANCEII+ NMR spectrometer
UltraShield Plus Superconducting magnet (9.4 T)

This is a solid-state nuclear magnetic resonance (NMR) apparatus. We can evaluate electronic states and dynamics of molecules/ions of samples by using nuclei as probes. MAS and PFG experiments can be also performed.
Resonance frequency for 1H: 400 MHz
Frequency range: 10 ~ 175 MHz, 370 ~ 420 MHz
Temperature range: 4 ~ 473 K (depending on experiments)
Nuclear species: 1H, 2H etc. (Various nuclei can be investigated by changing experimental setting.)

Bruker TG-DTA 2000SA / MS 9610 示差熱天秤 / 質量分析同時測定装置

TG

Bruker
TG-DTA 2000SA / MS 9610
Simultaneous thermogravimetry-mass spectroscopy apparatus

We can evaluate the thermal decompositions of sample. Simultaneous measurements of thermogravimetry (TG) of sample and mass spectroscopy (MS) of decomposed components is possible.
Mass spectrometry is available up to m/z = 410.
Thermogravimetric analysis can be performed from room temperature to 1500 ℃.
The degassing system enables easy gas replacement and drying.

ネッチ 示差走査熱量計 DSC 3500 Sirius

DSC

NETZSCH
Differential scanning calorimetry apparatus
DSC 3500 Sirius

We can detect the heat originates from reactions or phase transitions of sample on temperature changing process.
Temperature range: 123 K~873 K

Solartron SI 1260 インピーダンスゲイン相分析器 SI 1296 誘電インターフェース

交流インピーダンス装置

Solartron
SI 1260 IMPEDANCE/GAIN-PHASE ANALYZER
SI 1296 DIELECTRIC INTERFACE

This is a LCR meter capable of measuring high resistance.
By using a cryostat and incubator, a wide range of variable temperature and humidity experiments can be performed.
Temperature range: 4~475 K

Rigaku デスクトップX線回折装置 (MiniFlex600)

MiniFlex

Rigaku
BENCHTOP POWDER X-RAY DIFFRACTION (XRD) INSTRUMENT (MiniFlex600)

High-speed one-dimensional detector D/TeX Ultra enables measurements with intensities 100 times stronger than conventional methods.Can be measured under gas condition you want, using sample holder .
Can be measured with low background using Si non-reflective sample plate.
Sample rotation reduces the effect of orientation.
Real-time angle correction system and counter monochromator etc, Increase
basic performance.

アドバンス理工 アークプラズマガン成膜装置APD-2P

Plasma

Advance-Rico inc
Arc-Plasma method NP Deposition System APD-2P

New nanoparticle deposition system using pulse vacuum arc discharge

Bruker 迅速型粉末X線装置(BRUKER D8)

PXRD

Bruker
Rapid Powder X-Ray Diffractometer (BRUKER D8)

One-dimensional Position Sensitive Detector (PSD): conventional one-hour measurement can be done in about one minute, and conventional scintillation counter method is also available.
Variable temperature: 77-700K
Rotating sample table (suitable for Rietveld Refinement)
Parallel beam method, focused beam method (capillary measurement possible)
Horizontal sample table (for measurement of liquids and low-viscosity samples)
TOPAS Refinement software (Rietveld Refinement and structural modeling support software)
Non-reflective sample plate (for trace samples)
Gas introduction in-situ measurement is possible (to investigate gas adsorption)

エッペンドルフハイマック 小型超遠心機 CS 100FNX

ultracentrifuge

eppendorf himac co., Ltd.
Small ultracentrifuge CS 100FNX

Maximum rotation speed 100000 rpm, maximum centrifugal acceleration 571000 x g, It can also be used for particles of several nanometers, which were difficult to centrifuge generally.
In-use temperature 0-40 °
Thermo module cooling system adopted.

特注グローブボックス

glovebox

NEDO
Custom glove box system

Can be synthesized under an inert gas.Oxygen concentration can be controlled from several ppm to several tens of ppm

Rigaku 薄膜X線回折装置 SmartLab-9IP

薄膜XRD

Rigaku
SmartLab-9IP

The apparatus allows us to evaluate crystallinity and orientation of the sample through X-ray diffraction.

測定部屋

マイクロトラック・ベル 自動ガス/蒸気吸着量測定装置 BELSORP-18 PLUS

BELSORP-18 PLUS

MicrotracBEL
Auto gas/vapor sorption analyzer BELSORP-18 PLUS

In addition to the normal sorption measurement, this apparatus can analyze the sorption amount with high sensitivity by keeping the system temperature high and avoiding the sorption at the wall.

Rigaku ハイブリッドピクセル検出器搭載単結晶X線回折装置

SCXRD(Rigaku)

XtaLAB P200
Rigaku Corporation
Single-crystal X-ray diffractometer XtaLAB P200 incorporated DECTRIS PILATUS 200K hybrid pixel array detector

By irradiating X-ray to the single crystal, in which the direction of atomic order was completely same in one crystal, we can determine the spatial distribution of electron density and structure. The setup for the high pressure measurement using Diamond Anvil Cell (DAC) is available.

Rigaku ZSX PrimusIV 蛍光X線

XRF

Rigaku
ZSX PrimusIV X-ray fluorescence

This device is used to measure the intrinsic X-rays generated by irradiating a sample with X-rays to determine the elements contained in the sample and their proportions.

光学部屋

日立ハイテク SU-1510 汎用走査型分析電子顕微鏡

SEM

HITACHI
SU-1510 Scanning Electron Microscope(SEM)

By detecting the secondary electrons emitted by irradiating a sample with an electron beam, the surface microstructure of a sample can be observed on a nanometer scale.

日本分光 レーザーラマン分光光度計 NRS-5100

Raman

JASCO corporation
Laser Raman spectrometer NRS-5100

By irradiating laser to the sample, the vibration modes causing the change of polarizability can be measured.
Our lab has three kinds of laser sources, and variable temperature measurement is available.

HITACHI HT7700・QUANTAX200 透過型電子顕微鏡 エネルギー分散型X線分析

TEM・EDX

HITACHI
HT7700・QUANTAX200
Transmission Electron Microscope
Energy dispersive X-ray spectroscopy

TEM is a device for observing a sample by irradiating it with an electron beam and detecting the transmitted electrons.
EDX can be used to examine the constituent elements and their proportions by detecting the characteristic X-rays emitted when a sample is irradiated with an electron beam.

4号館

Bruker 迅速型粉末X線装置(BRUKER D8)

PXRD

Bruker

Rapid Powder X-Ray Diffractometer (BRUKER D8)

One-dimensional Position Sensitive Detector (PSD): conventional one-hour measurement can be done in about one minute, and conventional scintillation counter method is also available.
Variable temperature: 77-700K
Rotating sample table (suitable for Rietveld Refinement)
Parallel beam method, focused beam method (capillary measurement possible)
Horizontal sample table (for measurement of liquids and low-viscosity samples)
TOPAS Refinement software (Rietveld Refinement and structural modeling support software)
Non-reflective sample plate (for trace samples)
Gas introduction in-situ measurement is possible (to investigate gas adsorption)

マイクロトラック・ベル 触媒反応装置 BEL REACTOR-HT-MS-2

BEL REACTOR

Microtrac MRB co., Ltd.
Catalytic reaction system BEL REACTOR-HT-MS-2

A gas reactor for evaluating various solid-gas catalytic reactions.
Compatible with various conditions such as corrosive gas, high pressure, parallel multi-sample, and fully automatic.

バイオタージ・ジャパン マイクロウェーブ合成装置Initiator+ Eight マイクロウェーブ合成装置Initiator Eight

Microwave

Biotage Japan
Microwave synthesis Initiator+ eight
Microwave synthesis Initiator eight

By irradiating microwave to the sample tube, we can synthesize with controlled temperature (40-300 ℃), pressure (0-30 bar) and irradiation power (0-400 W).
The robot was installed on this apparatus, and it can automatically perform multisamples (up to eight) in a program.

DFC flow reactor

flow reactor

DFC
flow reactor

This is a reactor that allows chemical reactions to proceed by continuously flowing a solvent and precursor solution. Reactions can be carried out under reaction conditions of up to 500 ℃ and 30 MPa.

flow reactor

flow reactor

flow reactor

Advantageous for reactions that require accurate reaction control in nanoparticle synthesis, etc.
Can be synthesized under high pressure and high temperature, which cannot be achieved normally.
Mass synthesis is also possible.

flow reactor

flow reactor

flow reactor

Advantageous for reactions that require accurate reaction control in nanoparticle synthesis, etc.
Can be synthesized under high pressure and high temperature, which cannot be achieved normally.
Mass synthesis is also possible.

105

H CH Instruments 電気化学アナライザー ALS760E

CV

H CH Instruments
Electrochemical Analyzer ALS760E

Since chemical reactions in the sample cell can be detected electrically, the electrical properties and catalytic performance of the sample can be investigated through CV (cyclic voltammetry), OER (oxygen evolution reaction) and HER (hydrogen evolution reaction) measurements.

マイクロトラック・ベル 前処理装置 BELPREP VAC II

Belprep

MicrotracBEL
Pretreatment instrument BELPREP VAC II

This apparatus processes the heating treatment under vacuum to remove solvent and exactly measure specific surface area or pore size distribution.

マイクロトラック・ベル 自動比表面積/細孔分布測定装置 BELSORP-MINI

Bersorp mini

マイクロトラック・ベル

自動比表面積/細孔分布測定装置 BELSORP-MINI

This apparatus measures specific surface area and pore size distribution for non-corrosive gas (N2, H2, CH4,・・・).

マイクロトラック・ベル 自動比表面積/細孔分布測定装置 BELSORP-MAX

Bersorp max

MicrotracBEL
Surface area and size distribution analyzer BELSORP MAX

This apparatus enables the analysis of surface area and size distribution with wider range of adsorbates, the vapor of solvent such as water as well as non-corrosive gas.

マイクロトラック・ベル 高圧ガス吸着量測定装置 BELSORP HP

Bersorp HP

MicrotracBEL
High pressure gas sorption measurement BELSORP HP

This apparatus provides useful information for high pressure adsorption property up to 13.5 MPa.
A variety of measurement/pretreatment temperature can be chosen from 77 to 673 K.

マイクロトラック・ベル 触媒分析装置 BELCAT-B-MSP

BELCAT

Microtrac MRB co., Ltd.
catalyst analyzer

BELCAT II is the catalyst analyzer of choice for researchers in the according fields and enables comprehensive catalyst evaluation by using the following techniques:

5号館

PerkinElmer Spectrum 100R フーリエ変換赤外分光光度計

IR

PerkinElmer
Spectrum 100R FT-IR Spectrometer

When a sample is irradiated with infrared light, some of it is absorbed by the sample and the other is transmitted. Since the infrared energy corresponds to the energy levels of molecular vibration and rotation, the obtained spectrum can be used to study the molecular structure of the sample.
This device can be used for measurement using the diffuse reflection method.

日本分光 V-570 紫外可視近赤外分光光度計

UV

JASCO
V-570 UV-visible/NIR Spectrophotometer

When a sample is irradiated with ultraviolet, visible, or near-infrared light, some of the light is absorbed by the sample and the other is transmitted. The energy of these lights corresponds to the energy levels of the electronic transitions of the molecule, so the obtained spectra can be used to determine the electronic state of the sample.

サンユー電子 クイックコーター SC-701HMCII

DCスパッタ

SANYU ELECTRON
QUICK COATER SC-701HMCII

By applying a DC voltage between the target and the sample to be filmed in a vacuum state, the plasmaized gas molecules collide with the target, and the target particles are blown away and adhere to the sample to form a film.

サンユー電子 RFスパッタ装置 SVC-700RFII

RFスパッタ

SANYU ELECTRON
RF sputtering equipment SVC-700RFII

By applying an AC voltage between the target and the sample to be filmed in a vacuum, the plasmaized gas molecules collide with the target, and the target particles are blown away and adhere to the sample to form a film. Since the AC voltage is used, insulating targets can be used.

島津製作所 ICPE-9000 誘導結合プラズマ発光分光分析装置

ICP

Shimadzu
ICPE-9000 ICP-AES spectrometer

By dissolving a sample in an acid solution and measuring the concentration of elements in the solution, the amount of elements contained in the sample can be determined. Simultaneous measurement of multiple elements is also possible, making it suitable for composition analysis.

島津製作所 ESCA-3400 X線光電子分光装置

XPS

Shimadzu
ESCA-3400 X-ray photoelectron spectrometer

The sample is irradiated with X-rays, and the oxidation
state is evaluated by measuring the energy of
photoelectrons ejected from the sample surface.

山八物産 OMNI-LAB 2BOX 4連グローブボックス

glovebox

Yamahachi & Co., Ltd.
OMNI-LAB 2BOX 4-gloves glovebox

This is suitable for handling samples that must be synthesized or stored in an inert atmosphere. It is kept under Ar atmosphere (O2 concentration: below 1 ppm).

島津製作所 ガスクロマトグラフ質量分析計 GCMS-QP2010 Ultra

ガスクロマトグラフ質量分析計

Shimadzu
Gas chromatograph mass spectrometer GCMS-QP2010 Ultra

In the temperature range 35-600 ℃, mass spectrum was recorded by electron ionization method. In addition to the typical gas chromatograph measurement, we can measure with direct injection method, where the sample was introduced directly to the ionization source.

Quantel フラッシュ ランプ式組み上げレーザー Q-smart 450

レーザー

Quantel
Lamp pumped solid state laser Q-smart 450

This YAG laser stably irradiates the pulsed energy up to 450 mJ from and used for laser ablation or pulsed laser deposition. In addition to the normal 1032 nm irradiation, second (532 nm) and third (355 nm) harmonic wavelength is available.

プロトンビーム照射装置

プロトンビーム

Hydrogen ion beam apparatus

Hydrogen ion irradiates the sample with a maximum acceleration voltage of 5 kV.
In situ transport measurements can be performed simultaneously.